Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using a strain gauge Ingestion-build-89079 and durability for its users

and durability for its users

Pumped samplers which are used for the direct determination of concentrations

Manufacturers for spacecraft and space products

This version of BS 5974 replaces BS 5974:1990

The use of reference materials enables the transfer of the values of measured or assigned properties between testing and measurement laboratories

Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using a strain gauge Ingestion-build-89079 and durability for its users1 Scope This part of IEC 60749 is intended to evaluate and compare drop performance of a surface mount semiconductor device for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize test methodology to provide a reproducible assessment of the drop test performance of a surface mounted semiconductor devices while duplicating the