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BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 4 and divided into 5

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4 and divided into 5

ISO and other sources

General guidelines

and electronics industries

Consistency of Clause 9 Marking has been improved

BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 4 and divided into 5

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