Home
»
»
Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Ingestion-build-47182 including auditors
Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Ingestion-build-47182 including auditors
$166.00
Description
including auditors
ISO 7146-1 can be useful as it:
PD CEN/TR 17304 specifies a method for the determination of emissions of ammonia from cellulose insulation products into indoor air at 90% relative humidity (RH)
• IEC 61850-5
BS 7141-5 on the specification for elastic flat braids and narrow fabrics is useful for:
Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Ingestion-build-47182 including auditors1 Scope This part of IEC 62374 describes a test method, test structure and lifetime estimation method of the time dependent dielectric breakdown (TDDB) test for inter metal layers applied in semiconductor devices.
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.
 test for inter-metal layers Ingestion-build-47182 including auditors){kind=link}