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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 used in several areas of
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 used in several areas of
$166.00
Description
used in several areas of construction and frequently used in standards
power and specific power
but it can also be used for small series (a small number of process results)
liquefied natural gas (LNG) facilities and oil and gas production facilities
lightly impregnated with resin to provide mechanical stability
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 used in several areas of
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