Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773 Similar principles may apply to

Similar principles may apply to TSE agents

Annex A (normative) Determination and calculation of water absorption

Specific statutory

moving relative to a measuring scale on a rigid beam and to a fixed jaw

prEN ISO 15609-4

Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773 Similar principles may apply to1 Scope and object The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non hermetically packaged solid state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external