Corrosion of metals and alloys. Corrosion fatigue testing - Crack propagation testing using precracked specimens algolia-ignore Annex B was removed because

Annex B was removed because there are already procedures for circuit board assemblies

The areic dose of the ion-implanted analyte retained in the WoRM wafer is certified against the areic dose of the same analyte retained in an ion-implanted silicon wafer having the status of a (preferably certified) secondary reference material (SeRM)

BS EN 12519 is applicable to windows and pedestrian doors

Note 2: This standard is to be read in conjunction with EN 60317-0-6:2001 + A1:2006

with the exception of checks

Corrosion of metals and alloys. Corrosion fatigue testing - Crack propagation testing using precracked specimens algolia-ignore Annex B was removed because