Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry Ingestion-build-225643 3 Bottom surface requirements

3 Bottom surface requirements

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Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry Ingestion-build-225643 3 Bottom surface requirements1 Scope This Technical Report describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in ferro silicon materials. The method is applicable to: Al contents between 0,2 and 2 %; Ti contents between 0,02 and 0,25 %; P contents between 0,005 and 0,05 %. The procedure is valid for the analytical lines given in Table 1. This table also gives, for each line, the spectral interferences,