E19100 - SEMI E191 - Specification for Computing Device Cybersecurity Status Reporting StdPbc-0323 The test method is based

The test method is based on recording and evaluating images of the wafer surface obtained by a digital camera under directional transmitted or reflected light illumination

This is reported by two experiments

It is intended that personnel who operate

device designers

SEMI M71-0310 (technical revision)

E19100 - SEMI E191 - Specification for Computing Device Cybersecurity Status Reporting StdPbc-0323 The test method is based* This Standard has the option to purchase the Current document with a redline document (Current + Redline). The redline document is included with the Current document as a comparison tool to help identify changes that have been made between the Current version and the previous version (Superseded). If differences should exist between the redline document and the Current document, the Current version is the official and authoritative version. 1