JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Inventory # CONJ-2030

Inventory # CONJ-2030

Removed from a Nikon NSR-S307E DUV Scanning System BMU Unit Installed Component

7200-0459-04

Manufacturer Refurbished This Lam Research 716-011651-008 200mm Wafer Clamp Edge Ring is refurbished surplus

This Power-One RPM5A4A4C1CS676 Triple Output Power Supply is used working surplus

JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Inventory # CONJ-2030JEOL Column Mechanical Lens Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1320 Part No: Column Mechanical Lens Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Mechanical Lens Assembly JWS 2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but