M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Revision:SEMI M87-0422 - Current SEMI MF1529-02 (first SEMI publication)

SEMI MF1529-02 (first SEMI publication)

The purpose of this Document is to standardize requirements for xylene used in the semiconductor industry and to document testing procedures to support this Standard

The purpose of this Document is to standardize requirements for 2-propanol used in the semiconductor industry and testing procedures to support those standards

Provide guidelines of applying appropriate security measures for equipment to optimize cost

SEMI D71-0823 (technical revision)

M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Revision:SEMI M87-0422 - Current SEMI MF1529-02 (first SEMI publication)The purpose of this Test Method is to specify methods for the contactless measurement of the resistivity of semi insulating samples and wafers. This Test Method covers the determination of the electrical resistivity of semi insulating semiconductors, including GaAs, InP, CdTe, Cd(Zn)Te, SiC, GaN, and AlN, within the resistivity range 1E5 to 1E12 cm. It may also be used to characterize other materials exhibiting resistivity in this range, including in