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Understanding Semiconductor Technology & Business US/EU 05/26/26 StdPbc-0815 please visit: https://www

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SEMI M1 — Specification for Polished Single Crystal Silicon Wafers

SEMI G30 — Test Method for Junction-to-Case Thermal Resistance Measurements of Ceramic Packages

SEMI 3D14-0615 (first published)

which is commonly applied in both applications

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