SiC Webinar June 2023 - On Demand StdTpc-Jig ID the specimen need not be

the specimen need not be cut into a special shape

·        搬送用カセットとボックスとの間

This Specification is intended for use in procurement of polycrystalline silicon for growth of electronic grade monocrystalline silicon ingots

2  The purpose of this calibration is to ensure that different SSISs of a given manufacturer and model will assign the same light scattering equivalent (LSE) diameter to a specific localized light scatterer (LLS)

• extract the edge profile characteristic parameters by fitting lines or arcs to portions of the measured edge profile at defined distances from the periphery of the wafer and compare them with the specified values

SiC Webinar June 2023 - On Demand StdTpc-Jig ID the specimen need not be